Saturday, July 05, 2008

A Quiet Revolution in SEM

This is a good review of the current advancement in Scanning Electron Microscopy (SEM) technology.

However, there has been a quiet revolution in the world of the SEM, and slowly but surely, its capabilities are expanding. The instrument can now be used to study the surface of just about any bulk material at nanometre resolution and regardless of whether it is clean or dirty, wet or dry, hot or cold, conducting or insulating. Under the most favourable conditions, sub-nanometre resolution has been achieved — especially for thin specimens imaged in transmission mode.

If you're like me and have made frequent use of a SEM facility, you'll appreciate what this workhorse can do in a pinch.


No comments: